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Azimuthal Projections: Data Rotation and Projection Switching in Real Time

Published online by Cambridge University Press:  03 May 2013

Gert Nolze
Gert Nolze*
Affiliation:
Federal Institute for Materials Research and Testing, Department of Materials Engineering, 12205 Berlin, Germany
*
*Corresponding author. E-mail: gert.nolze@bam.de
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Abstract

Pole figures are often used to present crystal orientation data. The huge number of single orientation measurements acquired by electron backscatter diffraction (EBSD) poses a challenge for pole figure representation due to the large number of calculations required. This significantly reduces the speed at which the data may be rotated and affects the ability to switch between different projection types. In the present work, it will be shown that satisfactory representation of orientation data in different projection types can generally be achieved by an imaging of a spherical projection. With this approach, explicit calculation of the projections is no longer required, allowing for both real-time dataset rotation and real-time switching between all projection types relevant to materials science. The technique can be applied to any other directional property distribution, for example, not only for EBSD orientation presentation.

Keywords

stereographic projectionequal area projectiongnomonic projectionazimuthal projectioncrystal orientationprojection imagingcoordinate transformationreal-time rotation
Type
EBSD Special Section
Information
Microscopy and Microanalysis , Volume 19 , Issue 4 , August 2013 , pp. 950 - 958
Copyright
Copyright © Microscopy Society of America 2013 

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References

Basinger, J., Fullwood, D., Kacher, J. & Adams, B. (2011). Pattern center determination in electron backscatter diffraction microscopy. Microsc Microanal 17, 330–340.Google Scholar
Day, A. (2008). Spherical EBSD. J Microscopy 230, 472–486.Google Scholar
De Graef, M. & McHenry, M. (2007). Structure of Materials: An Introduction to Crystallography, Diffraction, and Symmetry. Cambridge, UK: Cambridge University Press.Google Scholar
Dohrn-van Rassum, G. (1996). History of the Hour: Clocks and Modern Temporal Orders. Chicago, IL: The University of Chicago Press.Google Scholar
Engler, O. & Randle, V. (2010). Introduction to Texture Analysis: Macrotexture, Microtexture and Orientation Mapping. Boca Raton, FL: CRC Press.Google Scholar
Kolbe, T.H., König, G. & Nagel, C. (Eds.) (2011). Lecture Notes in Geoinformation and Cartography: Advances in 3D Geo-Information Sciences. Berlin-Heidelberg, Germany: Springer-Verlag.Google Scholar
Kosel, T.H. (1984). Computational techniques for stereographic projection. J Mater Sci 19, 4106–4118.CrossRefGoogle Scholar
Liu, H. & Liu, J. (2012). SP2: A computer program for plotting stereographic projection and exploring crystallographic relationships. J Appl Crystallogr 45, 130–134.Google Scholar
Popko, E.S. (2012). Divide Spheres: Geodesics and the Orderly Subdivision of the Sphere. Boca Raton, FL: CRC Press.Google Scholar
Snyder, J.P. (1987). Map Projections: A Working Manual. USGS Professional Paper, 1395. Google Scholar
Tertsch, H. (1947). Das Geheimnis der Kristallwelt. Wien, Austria: Gerlach & Wiedling.Google Scholar
Winkelmann, A., Trager-Cowan, C., Sweeney, F., Day, A. & Parbrook, P. (2007). Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy 107, 414–421.Google Scholar