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[1]Goulden, J, Trimby, P and Bewick, A, Microscopy and Microanalysis24(S1) (2018), p. 1128.Google Scholar
[2]
[2]Maitland, T and Sitzman, S in “Scanning Microscopy for Nanotechnology, Techniques and Applications” ed. Zhou, W and Wang, ZL (Springer) p. 41.Google Scholar