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Beam-Induced Motion of Adatoms in the Transmission Electron Microscope

Published online by Cambridge University Press:  21 February 2013

R.F. Egerton
R.F. Egerton*
Affiliation:
Physics Department, University of Alberta, Edmonton T6G 2E1, Canada
*
*Corresponding author. E-mail: regerton@ualberta.ca
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Abstract

Equations governing the elastic scattering of electrons are applied to the knock-on displacement of atoms along a substrate, yielding analytical expressions for the surface-translation energy, threshold incident energy, and displacement rate. For a surface perpendicular to the incident beam, scattering angles around 90° contribute most to the kinetic energy of surface atoms. Tilting the specimen lowers the threshold incident energy for displacement and leads to anisotropy in the atomic motion but has little effect on the directionally-averaged displacement rate. The rate of beam-induced adatom motion is predicted to exceed that of room-temperature thermal motion when the surface-diffusion energy is greater than about 0.5 eV.

Keywords

knock-on displacementsingle-atom imagingscattering cross sectionscatalystsSTEM
Type
Software, Techniques, and Equipment Development
Information
Microscopy and Microanalysis , Volume 19 , Issue 2 , April 2013 , pp. 479 - 486
Copyright
Copyright © Microscopy Society of America 2013

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