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Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
[1]Luo, Z., et al. , Curr. Nanosci. 13 (2017), p. 364.Google Scholar
[2]
[2]George, G., et al. , Mater. Chem. C6 (2018), p. 7285Google Scholar
[3]
[3]George, G., et al. , RSC Adv. 8 (2018), p. 39296.Google Scholar
[4]
[4]Liu, Y., et al. , J. Mater. Chem. C6 (2018), p. 127Google Scholar
[5]
[5]Dong, H., et al. , ACS Nano11 (2017), p. 3289.Google Scholar
[6]
[6]Lay, A., et al. , Nano Lett. 17 (2017), p. 4172.Google Scholar
[7]
[7]Ananias, D., et al. , J. Am. Chem. Soc. 137 (2015), p. 3051.Google Scholar
[8]
[8]This work was supported by DoD ARO W911NF1810469, NSF HRD 1719511, and Oak Ridge Associated Universities (ORAU) FY 2017 ORAU-Directed Research and Development Grant, coordinated by Mrs. Cathy Fore at ORAU.Google Scholar