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Characterization of a Co-CoO Obliquely Evaporated Magnetic Tape by Analytical Electron Microscopy and Electron Holography

Published online by Cambridge University Press:  22 January 2004

Daisuke Shindo
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Sendai-shi 980-8577, Japan
Masasuke Hosokawa
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Sendai-shi 980-8577, Japan
Zheng Liu
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Sendai-shi 980-8577, Japan
Yasukazu Murakami
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Sendai-shi 980-8577, Japan
Takuya Ito
Affiliation:
Recording Media Company, MSNC, Sony Corporation, 3-4-1 Sakuragi, Tagajo-shi 985-0842, Japan
Yoh Iwasaki
Affiliation:
Recording Media Company, MSNC, Sony Corporation, 3-4-1 Sakuragi, Tagajo-shi 985-0842, Japan
Junichi Tachibana
Affiliation:
Recording Media Company, MSNC, Sony Corporation, 3-4-1 Sakuragi, Tagajo-shi 985-0842, Japan
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Abstract

The microstructure and magnetic domain structure of a Co-CoO obliquely evaporated tape for magnetic recording are studied by analytical electron microscopy and electron holography, respectively. While the existence of Co and CoO crystallites is confirmed by energy-filtered electron diffraction, columnar structure of the Co crystallites surrounded by the densely packed CoO crystallites is visualized by an elemental mapping method with electron energy loss spectroscopy, and the crystal orientation relation among the Co crystallites is clarified by high-resolution electron microscopy. It is found that the neighboring Co crystallites have close crystal orientations. On the other hand, electron holography reveals the magnetic flux distribution in a thin section of the tape. Although there exists the background resulting from the effect of inner potential with thickness variation, the distribution of lines of magnetic flux is found to correspond well to the recorded pattern.

Type
Research Article
Copyright
© 2004 Microscopy Society of America

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References

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