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Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction

Published online by Cambridge University Press:  29 September 2016

Mahrokh Dorri ,
Stéphane Turgeon ,
Nicolas Brodusch ,
Maxime Cloutier ,
Pascale Chevallier ,
Raynald Gauvin  and
Diego Mantovani
Mahrokh Dorri
Affiliation:
Laboratory for Biomaterials and Bioengineering, CRC-I, Department of Mining, Metallurgical and Materials Engineering, CHU de Québec Research Center, Laval University, Pavillon Pouliot, 1065 Medicine Street, Québec, QC, Canada, G1V 0A6 CHU Research Center of Quebec, 10 rue de l’Espinay, Room E0-165, Québec, QC, Canada, G1L 3L5
Stéphane Turgeon
Affiliation:
CHU Research Center of Quebec, 10 rue de l’Espinay, Room E0-165, Québec, QC, Canada, G1L 3L5
Nicolas Brodusch
Affiliation:
Mining and Materials Department, McGill University, Wong Building, 3610 University Street, Montréal, QC, Canada, H3A 0C5
Maxime Cloutier
Affiliation:
Laboratory for Biomaterials and Bioengineering, CRC-I, Department of Mining, Metallurgical and Materials Engineering, CHU de Québec Research Center, Laval University, Pavillon Pouliot, 1065 Medicine Street, Québec, QC, Canada, G1V 0A6 CHU Research Center of Quebec, 10 rue de l’Espinay, Room E0-165, Québec, QC, Canada, G1L 3L5
Pascale Chevallier
Affiliation:
CHU Research Center of Quebec, 10 rue de l’Espinay, Room E0-165, Québec, QC, Canada, G1L 3L5
Raynald Gauvin
Affiliation:
Mining and Materials Department, McGill University, Wong Building, 3610 University Street, Montréal, QC, Canada, H3A 0C5
Diego Mantovani*
Affiliation:
Laboratory for Biomaterials and Bioengineering, CRC-I, Department of Mining, Metallurgical and Materials Engineering, CHU de Québec Research Center, Laval University, Pavillon Pouliot, 1065 Medicine Street, Québec, QC, Canada, G1V 0A6 CHU Research Center of Quebec, 10 rue de l’Espinay, Room E0-165, Québec, QC, Canada, G1L 3L5
*
*Corresponding author.Diego.Mantovani@gmn.ulaval.ca
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Abstract

Characterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations.

Keywords

amorphousmicrostructureoxide layersurface modificationthickness
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 22 , Issue 5 , October 2016 , pp. 997 - 1006
Copyright
© Microscopy Society of America 2016 

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