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Characterization of High Numerical Aperture Multilayer Laue Lenses

Published online by Cambridge University Press:  10 August 2018

Kevin T. Murray ,
Andrew J. Morgan ,
Mauro Prasciolu ,
Istvan Mohacsi ,
Henry N. Chapman  and
Saša Bajt
Kevin T. Murray*
Affiliation:
Photon Science, DESY, Hamburg, Germany
Andrew J. Morgan
Affiliation:
Centre of Free-Electron Laser Science, DESY, Hamburg, Germany
Mauro Prasciolu
Affiliation:
Photon Science, DESY, Hamburg, Germany
Istvan Mohacsi
Affiliation:
Photon Science, DESY, Hamburg, Germany
Henry N. Chapman
Affiliation:
Centre of Free-Electron Laser Science, DESY, Hamburg, Germany Department of Physics, University of Hamburg, Hamburg, Germany. Centre of Ultrafast Imaging, Hamburg, Germany.
Saša Bajt
Affiliation:
Photon Science, DESY, Hamburg, Germany
*
* Corresponding author, kevin.murray@desy.de

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 280 - 281
Copyright
© Microscopy Society of America 2018 

References

[1] Yan, H., et al, X-Ray Opt. and Instr 2010(2010), 40 1854.Google Scholar
[2] Bajt, S., et al, LSA 7 2018 17162.Google Scholar
[3] Morgan, A. J., et al, Sci. Rep. 5 2015 09892.Google Scholar
[4] Prasciolu, M., et al, Opt. Mat. Expr 748 2015 228318.Google Scholar
[5] Chu, T. C., et al, Exp. Mech. 25 1985) p. 232–244.Google Scholar
[6] Berujon, S., et al, PRL 108 2012 158102.Google Scholar
[7] Yan, H., et al, Opt. Expr 25(No. 21 2017) p. 25234.Google Scholar
[8] The authors acknowledge funding by the Helmholtz Association through project-oriented funds. We would also like to thank Sabrina Bolmer for technical support.Google Scholar