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Characterization of Materials at the Nanoscale Using Hard X-ray Microspectroscopy Techniques

Published online by Cambridge University Press:  10 August 2018

Gema Martinez-CriadGema Martínez-Criado ,
Rémi Tucoulou ,
Julie Villanova ,
Damien Salomon  and
Sylvain Labouré
Gema Martinez-CriadGema Martínez-Criado*
Affiliation:
Instituto de Ciencia de Materiales de Madrid (CSIC), 28049-Cantoblanco, Madrid, Spain Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
Rémi Tucoulou
Affiliation:
Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
Julie Villanova
Affiliation:
Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
Damien Salomon
Affiliation:
Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
Sylvain Labouré
Affiliation:
Experiments Division, European Synchrotron Radiation Facility, 38043-Grenoble, France
*
* Corresponding author, gema.martinez.criado@csic.es

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 522 - 525
Copyright
© Microscopy Society of America 2018 

References

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[4] Tucoulou, R, et al, J. Synchrotron Rad 15 2008 392.Google Scholar
[5] Luo, Y, et al, Advanced Materials 29 2017 1703451.CrossRefGoogle Scholar
[6] Salomon, D, et al, Nano Letters 17 2017 946.Google Scholar
[7] Yoneda, H, et al, Nature Communications 5 2014 5080.Google Scholar
G. Martinez-Criado has been partially supported by the ESRF, CSIC & MINECO (EUIN-2017-88844)..Google Scholar