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Characterization of Misfit Dislocations at Heterovalent II-VI/III-V Interfaces

Published online by Cambridge University Press:  05 August 2019

B.S. McKeon ,
X. Liu ,
J.K. Furdyna  and
David J. Smith
B.S. McKeon*
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287, USA
X. Liu
Affiliation:
Department of Physics, University of Notre Dame, Notre Dame, IN 46556, USA
J.K. Furdyna
Affiliation:
Department of Physics, University of Notre Dame, Notre Dame, IN 46556, USA
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287, USA
*
*Corresponding author: brandon.mckeon@asu.edu

Abstract

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Type
Microstructural and Mechanical Characterization of Metallic Alloys
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2610 - 2611
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Alferov, Z.I., Semiconductors 32 (1998), p. 1-14.Google Scholar
[2]Ouyang, L., et al. , J. Cryst. Growth 330 (2011), p. 30-34.Google Scholar
[3]Dasilva, Y.A.R., et al. , Ultramicroscopy 176 (2017), p. 11-22.Google Scholar
[4]This work was supported by Army Research Office Grant #W911NF-16-1-0263. The authors gratefully acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar