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Characterization of Nanoporous Materials with Atom Probe Tomography

Published online by Cambridge University Press:  20 May 2015

Björn Pfeiffer ,
Torben Erichsen ,
Eike Epler ,
Cynthia A. Volkert ,
Piet Trompenaars  and
Carsten Nowak
Björn Pfeiffer*
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund Platz 1, 37077 Göttingen, Germany
Torben Erichsen
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund Platz 1, 37077 Göttingen, Germany
Eike Epler
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund Platz 1, 37077 Göttingen, Germany
Cynthia A. Volkert
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund Platz 1, 37077 Göttingen, Germany
Piet Trompenaars
Affiliation:
FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands
Carsten Nowak
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund Platz 1, 37077 Göttingen, Germany
*
*Corresponding author.bpfeiffer@ump.gwdg.de
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Abstract

A method to characterize open-cell nanoporous materials with atom probe tomography (APT) has been developed. For this, open-cell nanoporous gold with pore diameters of around 50 nm was used as a model system, and filled by electron beam-induced deposition (EBID) to obtain a compact material. Two different EBID precursors were successfully tested—dicobalt octacarbonyl [Co2(CO)8] and diiron nonacarbonyl [Fe2(CO)9]. Penetration and filling depth are sufficient for focused ion beam-based APT sample preparation. With this approach, stable APT analysis of the nanoporous material can be performed. Reconstruction reveals the composition of the deposited precursor and the nanoporous material, as well as chemical information of the interfaces between them. Thus, it is shown that, using an appropriate EBID process, local chemical information in three dimensions with sub-nanometer resolution can be obtained from nanoporous materials using APT.

Keywords

atom probe tomographynanoporous materialtomographic reconstructionelectron beam-induced depositionnanoporous gold
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 21 , Issue 3 , June 2015 , pp. 557 - 563
Copyright
© Microscopy Society of America 2015 

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