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Characterization of Nano-Scale Defects in Pulsed Laser Deposited (PLD) Thin Films of Li3xNd(2/3-x)(1/3-2x)TiO3 (NLTO) by Aberration Corrected HR-STEM Imaging and Dual-EELS

Published online by Cambridge University Press:  30 July 2020

Robert Williams ,
Nuria Bagues ,
Elahe Farghadany ,
Alp Sehirlioglu  and
David McComb
Robert Williams
Affiliation:
The Ohio State University, Hilliard, Ohio, United States
Nuria Bagues
Affiliation:
The Ohio State University, Columbus, Ohio, United States
Elahe Farghadany
Affiliation:
Case Western Reserve Univeristy, Cleveland, Ohio, United States
Alp Sehirlioglu
Affiliation:
Case Western Reserve Univeristy, Cleveland, Ohio, United States
David McComb
Affiliation:
Center for Electron Microscopy and Analysis/ Department of Material Science and Engineering, The Ohio State University, Columbus, Ohio, United States

Abstract

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Type
Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3166 - 3167
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Copyright
Copyright © Microscopy Society of America 2020

References

Dholabhai, P.P., et al. , Nature Communications, 5:5043, 2014 . doi:10.1038/ncomms6043CrossRefGoogle Scholar
Stramere, S., et al. , Chemical Materials, (15) 3974, 2003.Google Scholar