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Characterization of Porous, TiO2 Nanoparticle Films Using On-Axis TKD in SEM -a New Nano-Analysis Tool for a Large-Scale Application

Published online by Cambridge University Press:  04 August 2017

Nicole Wollschläger ,
Ines Häusler ,
Erik Ortel ,
Vasile-Dan Hodoroaba ,
Laurie Palasse  and
Kai Dirscherl
Nicole Wollschläger
Affiliation:
BAM Bundesanstalt für Materialforschung und -prüfung, Unter den Eichen 87, Berlin, Germany.
Ines Häusler
Affiliation:
BAM Bundesanstalt für Materialforschung und -prüfung, Unter den Eichen 87, Berlin, Germany.
Erik Ortel
Affiliation:
BAM Bundesanstalt für Materialforschung und -prüfung, Unter den Eichen 87, Berlin, Germany.
Vasile-Dan Hodoroaba
Affiliation:
BAM Bundesanstalt für Materialforschung und -prüfung, Unter den Eichen 87, Berlin, Germany.
Laurie Palasse
Affiliation:
Bruker Nano GmbH, Am Studio 2D, Berlin, Germany.
Kai Dirscherl
Affiliation:
Danish Fundamental Metrology, Matematiktorvet 307, Kongens Lyngby, Denmark.

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 542 - 543
Copyright
© Microscopy Society of America 2017 

References

[1] Taleb, A, et. al, Sol. Energ. Mat. Sol. C. 148 2016). p. 52.Google Scholar
[2] Ortel, E, et al, Microsc. Microanal. 21(Suppl 3 2015). p. 2401.Google Scholar
[3] Keller, R R & Geiss, R H J. Microsc.-Oxford 245 2012 p245.Google Scholar
[4] Abbasi, M, et. al, ACS Nano 9 2015). p. 10991.Google Scholar
[5] This work was supported by the SETNanoMetro Seventh Framework Programme project (project number 604577; call identifier FP7-NMP-2013_LARGE-7). Thanks to Pawel Nowakowski from E. A. Fischione Instruments, Inc. for careful polishing of our samples.Google Scholar