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Characterization of Tungsten Surfaces by Simultaneous Work Function and Secondary Electron Emission Measurements

Published online by Cambridge University Press:  01 August 2003

Gy. Vida ,
V.K. Josepovits ,
M. Győr  and
P. Deák
Gy. Vida
Affiliation:
Budapest University of Technology and Economics, Department of Atomic Physics, Surface Physics Laboratory, Budafoki ut 8, Budapest, H-1111, Hungary
V.K. Josepovits
Affiliation:
Budapest University of Technology and Economics, Department of Atomic Physics, Surface Physics Laboratory, Budafoki ut 8, Budapest, H-1111, Hungary
M. Győr
Affiliation:
General Electric Hungary Tungsram Lighting, High Intensity Discharge Lamp Technology, Váci ut 77, Budapest, H-1042 Hungary
P. Deák
Affiliation:
Budapest University of Technology and Economics, Department of Atomic Physics, Surface Physics Laboratory, Budafoki ut 8, Budapest, H-1111, Hungary
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Abstract

The changes of the work function (Φ) and the secondary electron emission (SEE) of oxygen covered polycrystalline tungsten occurring after ion sputtering and heat treatments have been investigated. The chemical composition was analyzed by X-ray photoelectron spectroscopy (XPS), and the electron emission properties by work function spectroscopy (WFS). We observed in what manner the chemical changes of the surface are reflected in the work function and SEE. The simultaneous change of Φ and SEE in the case of oxygen covered tungsten have been pointed out and a direct relationship between them can be supposed.

Keywords

tungstenwork functionsecondary electron emissiondischarge lamps
Type
Fifth EMAS Regional Workshop: Electron Probe Microanalysis Today—Practical Aspects
Information
Microscopy and Microanalysis , Volume 9 , Issue 4 , August 2003 , pp. 337 - 342
Copyright
© 2003 Microscopy Society of America

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