Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-30T22:02:59.929Z Has data issue: false hasContentIssue false
  • English
  • Français

Charge Contrast Imaging of Gibbsite in the Variable Pressure SEM

Published online by Cambridge University Press:  01 August 2002

K. Robertson ,
R. Gauvin  and
J. Finch
K. Robertson
Affiliation:
McGill University, Mining, Metals and Materials Engineering, M.H. Wong building, 3610 University Street, Montreal, Quebec, H3A 2B2
R. Gauvin
Affiliation:
McGill University, Mining, Metals and Materials Engineering, M.H. Wong building, 3610 University Street, Montreal, Quebec, H3A 2B2
J. Finch
Affiliation:
McGill University, Mining, Metals and Materials Engineering, M.H. Wong building, 3610 University Street, Montreal, Quebec, H3A 2B2

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1536 - 1537
Copyright
Copyright © Microscopy Society of America 2002