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Clustering and Local Magnification Effects in Atom Probe Tomography: A Statistical Approach

Published online by Cambridge University Press:  20 September 2010

Thomas Philippe ,
Maria Gruber ,
François Vurpillot  and
D. Blavette
Thomas Philippe*
Affiliation:
Université de Rouen, GPM, UMR CNRS 6634, BP 12, Av. de l'université, 76801 Saint Etienne du Rouvray, France
Maria Gruber
Affiliation:
Université de Rouen, GPM, UMR CNRS 6634, BP 12, Av. de l'université, 76801 Saint Etienne du Rouvray, France
François Vurpillot
Affiliation:
Université de Rouen, GPM, UMR CNRS 6634, BP 12, Av. de l'université, 76801 Saint Etienne du Rouvray, France
D. Blavette
Affiliation:
Université de Rouen, GPM, UMR CNRS 6634, BP 12, Av. de l'université, 76801 Saint Etienne du Rouvray, France Institut Universitaire de France, France
*
Corresponding author. E-mail: thomas.philippe@etu.univ-rouen.fr
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Abstract

Local magnification effects and trajectory overlaps related to the presence of a second phase (clusters) are key problems and still open issues in the assessment of quantitative composition data in three-dimensional atom probe tomography (APT) particularly for tiny solute-enriched clusters. A model based on the distribution of distance of first nearest neighbor atoms has been developed to exhibit the variations in the apparent atomic density in reconstructed volumes and to correct compositions that are biased by local magnification effects. This model was applied to both simulated APT reconstructions and real experimental data and shows an excellent agreement with the expected composition of clusters.

Keywords

atom probe tomographylocal magnification effectsclusteringnearest neighbor distances
Type
Atomic Force and Atom Probe Applications
Information
Microscopy and Microanalysis , Volume 16 , Issue 5 , October 2010 , pp. 643 - 648
Copyright
Copyright © Microscopy Society of America 2010

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References

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