Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-28T12:45:32.399Z Has data issue: false hasContentIssue false
  • English
  • Français

A Compact High Solid Angle EDX Detector System for SEM and TEM

Published online by Cambridge University Press:  04 August 2017

A. Schoning ,
R. Lackner ,
A. Bechteler ,
A. Liebel ,
A. Niculae  and
H. Soltau
A. Schoning
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munchen, Germany
R. Lackner
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munchen, Germany
A. Bechteler
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munchen, Germany
A. Liebel
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munchen, Germany
A. Niculae
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munchen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739 Munchen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 76 - 77
Copyright
© Microscopy Society of America 2017 

References

[1] Niculae, A, et al, Microscopy & Microanalysis vol. 18(S2 2012). p. 1202–1203.CrossRefGoogle Scholar