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A Comparison of Ga FIB and Xe-Plasma FIB of Complex Al Alloys

Published online by Cambridge University Press:  04 August 2017

Alexis Ernst
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT, USA
Mei Wei
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT, USA
Mark Aindow
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

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[6] This work was supported in part by a research grant from FEI Company under an FEI-UConn partnership agreement. The studies were performed in the UConn/FEI Center for Advanced Microscopy and Materials Analysis (CAMMA).Google Scholar