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Comparison of Techniques for Fine Alignment of Image Stacks in Serial Block-Face Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Q. He ,
M. Guay ,
G. Zhang  and
R.D. Leapman
Q. He
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD, USA
M. Guay
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD, USA
G. Zhang
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD, USA
R.D. Leapman*
Affiliation:
National Institute of Biomedical Imaging and Bioengineering, NIH, Bethesda, MD, USA
*
*Corresponding author: leapmanr@mail.nih.gov

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 148 - 149
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Deerinck, TJ, et al. , J. Microsc. 270 (2018), p.142.Google Scholar
[2]Lowe, D, Int. J. Computer Vision 60 (2004), p.91.Google Scholar
[3]Kremer, JR, Mastronarde, DN and McIntosh, JR, J. Struct. Biol. 116 (1996), p.71.Google Scholar
[4]Bria, A, Iannello, G, BMC Bioinformatics. 13 (2012), p.316.Google Scholar
[5]This research was supported by the intramural program of the National Institute of Biomedical Imaging and Bioengineering, National Institutes of Health.Google Scholar