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Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior

Published online by Cambridge University Press:  30 July 2020

Abinash Kumar ,
Jonathon Baker ,
Matthew Cabral ,
Preston Bowes ,
Shujun Zhang ,
Elizabeth Dickey ,
Douglas Irving  and
James LeBeau
Abinash Kumar
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Jonathon Baker
Affiliation:
North Carolina State University, Raleigh, North Carolina, United States
Matthew Cabral
Affiliation:
University of Sydney, Sydney, New South Wales, Australia
Preston Bowes
Affiliation:
North Carolina State University, Raleigh, North Carolina, United States
Shujun Zhang
Affiliation:
University of Wollongong, Wollongong, New South Wales, Australia
Elizabeth Dickey
Affiliation:
North Carolina State University, Raleigh, North Carolina, United States
Douglas Irving
Affiliation:
North Carolina State University, Raleigh, North Carolina, United States
James LeBeau
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States

Abstract

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Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 490 - 493
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Copyright
Copyright © Microscopy Society of America 2020

References

Takenaka, H., Grinberg, I., Liu, S. and Rappe, A. M., Nature 546 (2017), p.391.10.1038/nature22068CrossRefGoogle Scholar
Li, F. et al. , Nature Communications 7(2016), p. 13807.10.1038/ncomms13807CrossRefGoogle Scholar
Krogstad, M. J. et al. , Nature Materials 17(2018) p. 718–724.10.1038/s41563-018-0112-7CrossRefGoogle Scholar
This material is based upon work supported by the National Science Foundation, as part of the Center for Dielectrics and Piezoelectrics under Grant Nos. IIP-1841453 and IIP-1841466.Google Scholar