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Compressive Classification for TEM-EELS

Published online by Cambridge University Press:  04 August 2017

Weituo Hao ,
Andrew Stevens ,
Hao Yang ,
Michael Gehm  and
Nigel D. Browning
Weituo Hao
Affiliation:
Pacific Northwest National Laboratory, Richland, WAUSA.
Andrew Stevens
Affiliation:
Pacific Northwest National Laboratory, Richland, WAUSA. Duke University, Electrical and Computer Engineering, Durham, NCUSA.
Hao Yang
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CAUSA.
Michael Gehm
Affiliation:
Duke University, Electrical and Computer Engineering, Durham, NCUSA.
Nigel D. Browning
Affiliation:
Pacific Northwest National Laboratory, Richland, WAUSA. University of Washington, Materials Science and Engineering, Seattle, WAUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 108 - 109
Copyright
© Microscopy Society of America 2017 

References

[1] Stevens, A, Kovarik, L, Yang, H, et al, Microscopy and Microanalysis 22(S3 2016). pp. 560.Google Scholar
[2] Stevens, A, Kovarik, L, Abellan, P, et al, Adv. Structural and Chemical Imaging 1(10 2015). pp. 1.Google Scholar
[3] Stevens, A, Yang, H, Carin, L, et al, Microscopy 63(1 2014). pp. 41.Google Scholar
[4] Mucke, D, Abellan, P, Sarahan, M, et al, Microscopy & Microanalysis 22(S3 2016). pp 558.CrossRefGoogle Scholar
[5] Kovarik, L, Stevens, A, Liyu, A, et al, Appl. Phys. Lett. 109, 164102 2016.Google Scholar
[6] Davenport, M, Boufounos, P, Wakin, M, et al, Sel. Top. in Sig. Proc., IEEE Jour 4(2 2010). pp. 445.Google Scholar
[7] Reboredo, H, Renna, F, Calderban, R, et al, Sig. Proc., IEEE Trans 64(22 2016). pp. 5778.Google Scholar
[8] Poon, P, Vera, E & Gehm, M Computational Imaging, SPIE 9870, 987003 2016.Google Scholar
[9] Supported by the Chemical Imaging, Signature Discovery, and Analytics in Motion initiatives at PNNL. PNNL is operated by Battelle Memorial Inst. for the US DOE; contract DE-AC05-76RL01830.Google Scholar