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Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions

Published online by Cambridge University Press:  22 July 2022

Santhana Eswara ,
Saba Tabean ,
Michael Mousley ,
Quang Hung Hoang ,
Olivier Bouton ,
Olivier De Castro ,
Eduardo Serralta ,
Nico Klingner ,
Gregor Hlawacek  and
Tom Wirtz
Santhana Eswara*
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, Belvaux, Luxembourg
Saba Tabean
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, Belvaux, Luxembourg
Michael Mousley
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, Belvaux, Luxembourg
Quang Hung Hoang
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, Belvaux, Luxembourg
Olivier Bouton
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, Belvaux, Luxembourg
Olivier De Castro
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, Belvaux, Luxembourg
Eduardo Serralta
Affiliation:
Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany
Nico Klingner
Affiliation:
Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany
Gregor Hlawacek
Affiliation:
Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany
Tom Wirtz
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, Belvaux, Luxembourg
*
*Corresponding author: santhana.eswara@list.lu

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 34 - 35
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Copyright
Copyright © Microscopy Society of America 2022

References

Mousley, M. et al. , Beilstein J. Nanotechnol., 10, 1648-1657 (2019)CrossRefGoogle Scholar
Serralta, E. et al. , Beilstein J. Nanotechnol., 11, 1854-1864 (2020)CrossRefGoogle Scholar
De Castro, O. et al. , Anal. Chem. 93, 14417–14424 (2021)CrossRefGoogle Scholar
Tabean, S. et al. , Ultramicroscopy, 233, 113439 (2022)CrossRefGoogle Scholar
The authors acknowledge funding from the Luxembourg National Research Fund (FNR) by the grant STHIM (C16/MS/11354626) and PRIDE17/12246511/PACE. This work also received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964.Google Scholar