Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Yamasaki, Jun
Kawai, Tomoyuki
Kondo, Yushi
and
Tanaka, Nobuo
2008.
A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM.
Microscopy and Microanalysis,
Vol. 14,
Issue. 1,
p.
27.
Tanaka, Nobuo
2008.
Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy.
Vol. 153,
Issue. ,
p.
385.
Kabius, Bernd
and
Rose, Harald
2008.
Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy.
Vol. 153,
Issue. ,
p.
261.
2022.
Principles of Electron Optics, Volume 3.
p.
1869.