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Controlled Growth of Silicon Dioxide Nanospheres by Regulation in the Addition Rate of the Precursor

Published online by Cambridge University Press:  05 August 2019

Isidoro López-Miranda ,
Eduardo Ortiz-Rascón ,
Leonardo Baez-Castillo ,
Roberto C. Carrillo-Torres  and
Mario E. Álvarez-Ramos
Isidoro López-Miranda
Affiliation:
Departamento de Física, Universidad de Sonora, Hermosillo, Sonora, México.
Eduardo Ortiz-Rascón*
Affiliation:
CONACYT–Departamento de Física, Universidad de Sonora, Hermosillo, Sonora, México.
Leonardo Baez-Castillo
Affiliation:
Departamento de Física, Universidad de Sonora, Hermosillo, Sonora, México.
Roberto C. Carrillo-Torres
Affiliation:
Departamento de Física, Universidad de Sonora, Hermosillo, Sonora, México.
Mario E. Álvarez-Ramos
Affiliation:
Departamento de Física, Universidad de Sonora, Hermosillo, Sonora, México.
*
*Corresponding author: eduardo.ortiz@fisica.uson.mx

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2382 - 2383
Copyright
Copyright © Microscopy Society of America 2019 

References

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[8]The authors acknowledge funding from the Consejo Nacional de Ciencia y Tecnología (CONACyT), through projects 573 and 255791-INFR 2015.Google Scholar