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Convolutional Neural Network as a Solution to Segment and Classify High Resolution TEM Images to Obtain 3D Information
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
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- Copyright
- Copyright © Microscopy Society of America 2022
References
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The authors acknowledge funding from NSF (DMR 1840841, OAC 1940263 HDR 1940097, OAC 2103936, HDR 1922658), the Simons Foundation, and the use of facilities of Eyring Materials Center at Arizona State University.Google Scholar
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