Hostname: page-component-745bb68f8f-kw2vx Total loading time: 0 Render date: 2025-01-07T17:17:13.270Z Has data issue: false hasContentIssue false
  • English
  • Français

Dark-field TEM study of the microstructural behavior in AZ31B/MWCNTs composites produced by the sandwich technique

Published online by Cambridge University Press:  30 July 2021

Cesar Isaza ,
Yamile Cardona-Maya ,
Juan Rudas ,
C. Carreño-Gallardo ,
José Herrera-Ramirez  and
Juan Meza
Cesar Isaza
Affiliation:
Institución Universitaria Pascual Bravo, Facultad de Ingeniería, Grupo GIIEN, A. A. 6564, campus Robledo, Medellín, Colombia., United States
Yamile Cardona-Maya
Affiliation:
Departamento de Ciencias Básicas, Universidad Católica Luis Amigó, Transversal 51A #67B 90, Medellín, Colombia., Antioquia, Colombia
Juan Rudas
Affiliation:
Institución Universitaria Pascual Bravo, Facultad de Ingeniería, Grupo GIIEN, A. A. 6564, campus Robledo, Medellín, Colombia., United States
C. Carreño-Gallardo
Affiliation:
Centro de Investigación en Materiales Avanzados (CIMAV), Chihuahua, Chihuahua, Mexico
José Herrera-Ramirez
Affiliation:
Centro de Investigación en Materiales Avanzados (CIMAV), Laboratorio Nacional de Nanotecnología, Miguel de Cervantes 120, 31136Chihuahua, México, United States
Juan Meza
Affiliation:
Universidad Nacional de Colombia, Facultad de Minas, Departamento de Materiales y Minerales, Design of Advanced Composites (DADCOMP), Cl 75 No 79A 51, 050032, Medellín, Colombia, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 734 - 736
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Chawla, KK. Compos. Mater., Spring. N.Y.; 2012, p. 197-248.CrossRefGoogle Scholar
Li, C, Thostenson, ET, Chou, T-W. Comps. Sci. and Tech., 2008, p. 1227-1249.CrossRefGoogle Scholar
Merino, CAI, Ledezma, JE, Meza, JM, Herrera Ramirez, JM. Elsevier, J. of All. and Compo., 2016, p 257-263Google Scholar
Ramirez, J, Bustamante, R, Merino, C. Spring., 2020, p. 1-232.Google Scholar
Salama, E, Abbas, A, and AE-CPAAS, Compos. P. A: Appl. Sci. and Manuf., 2017, p. 84-93.CrossRefGoogle Scholar
Xu, JQ, Chen, LY, Choi, H, Li, XC. J. of Phys.: Cond. Matt. 2012, p. 1-10Google Scholar