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Dedicated X-Ray mapping system with single and multiple SDD detectors for quantitative X-Ray mapping and data processing

Published online by Cambridge University Press:  23 September 2015

Richard Wuhrer  and
Ken Moran
Richard Wuhrer
Affiliation:
University of Western Sydney, Advanced Materials Characterisation Facility (AMCF), Australia
Ken Moran
Affiliation:
Moran Scientific Pty Ltd, 4850 Oallen Ford Road, Bungonia, NSW, 2580, Australia

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2191 - 2192
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Moran, K. and Wuhrer, R., "Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors. Mikrochimica Acta Vol. 155, pp. 59–66 (2006).Google Scholar
[2] Moran, K. and Wuhrer, R. "X-ray mapping and interpretation of scatter diagrams. Mikrochimica Vol. 155, pp. 209–217 (2006).Google Scholar
[3] Wuhrer, R., Moran, K. and Phillips, M. R., "Multi-detector X-Ray mapping and generation of correction factor images for problem solving. Microscopy and Microanalysis 14 (No 2), 1108CD-1109CD 2008.CrossRefGoogle Scholar
[4] Wuhrer, R., Moran, K. and Phillips, M. R., "X-Ray mapping and post processing. Microscopy and Microanalysis 12 (No 2), 1404CD-1405CD (2006).Google Scholar