Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-29T02:54:14.617Z Has data issue: false hasContentIssue false
  • English
  • Français

Deep Learning Segmentation for Epifluorescence Microscopy Images

Published online by Cambridge University Press:  04 August 2017

Yasmin M. Kassim ,
Olga V. Glinskii ,
Vladislav V. Glinsky ,
Virginia H. Huxley  and
Kannappan Palaniappan
Yasmin M. Kassim
Affiliation:
Computational Imaging and VisAnalysis (CIVA) Lab, Department of Electrical Eng. and Computer Science/University of Missouri-Columbia, Columbia, MO, USA.
Olga V. Glinskii
Affiliation:
Department of Medical Pharmacology and Physiology/University of Missouri-Columbia, Columbia, MO, USA. Research Service, Harry S. Truman Memorial Veterans Hospital, Columbia, MO, USA.
Vladislav V. Glinsky
Affiliation:
Department of Pathology and Anatomical Sciences/University of Missouri-Columbia, Columbia, MO, USA. Research Service, Harry S. Truman Memorial Veterans Hospital, Columbia, MO, USA.
Virginia H. Huxley
Affiliation:
Department of Medical Pharmacology and Physiology/University of Missouri-Columbia, Columbia, MO, USA. Research Service, Harry S. Truman Memorial Veterans Hospital, Columbia, MO, USA.
Kannappan Palaniappan
Affiliation:
Computational Imaging and VisAnalysis (CIVA) Lab, Department of Electrical Eng. and Computer Science/University of Missouri-Columbia, Columbia, MO, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 140 - 141
Copyright
© Microscopy Society of America 2017 

References

[1] Vedaldi, A., et al, ACM Inter. Conf. Multi. 2015). p. 689.Google Scholar
[2] Nguyen, U. T. V., Bhuiyan, A. & Park, L. A. F. Pattern Recognition 46 2013). p. 703.CrossRefGoogle Scholar
[3] Sironi, A., Turetken, E. & Lepetit, V. IEEE Trans. Patt. Anal. Mach. Intell 38 2015). p. 1327.Google Scholar