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Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity

Published online by Cambridge University Press:  04 August 2017

SH Lau ,
Sylvia JY Lewis ,
Wenbing Yun ,
Benjamin Stripe ,
Janos Kirz ,
Alan Lyon ,
David Reynolds  and
Richard Ian Spink
SH Lau
Affiliation:
Sigray, Inc. Concord, CAUSA
Sylvia JY Lewis
Affiliation:
Sigray, Inc. Concord, CAUSA
Wenbing Yun
Affiliation:
Sigray, Inc. Concord, CAUSA
Benjamin Stripe
Affiliation:
Sigray, Inc. Concord, CAUSA
Janos Kirz
Affiliation:
Sigray, Inc. Concord, CAUSA
Alan Lyon
Affiliation:
Sigray, Inc. Concord, CAUSA
David Reynolds
Affiliation:
Sigray, Inc. Concord, CAUSA
Richard Ian Spink
Affiliation:
Sigray, Inc. Concord, CAUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 44 - 45
Copyright
© Microscopy Society of America 2017 

References

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[1] Butler, , et al, Journal of Analytical Atomic Spectrometry 2016.Google Scholar
[2] Limbeck, , et al, Analytical andBioanalytical Chemistry 2015.Google Scholar
[3] The authors acknowledge funding from the NSF, Division of Industrial Innovation & Partnerships for the development of x-ray mirror lens (IIP-1448727) and the NIH, National Institute of General Medicine Science for the development of the microstructured source target (GRANT11545218).Google Scholar