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Development of Laboratory Grating-based X-ray Phase Contrast Microtomography for Improved Pathology

Published online by Cambridge University Press:  10 August 2018

Joan Vila-Comamala ,
Carolina Arboleda ,
Lucia Romano ,
Willy Kuo ,
Kristina Lang ,
Konstantins Jefimovs ,
Zhentian Wang ,
Gad Singer ,
David Vine  and
Wenbing Yun
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Joan Vila-Comamala*
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
Carolina Arboleda
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
Lucia Romano
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland. Department of Physics and CNR-IMM, University of Catania, Catania, Italy
Willy Kuo
Affiliation:
University of Zurich, Zurich, Switzerland.
Kristina Lang
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland. Department of Diagnostic Radiology, Lund University, Lund, Sweden
Konstantins Jefimovs
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
Zhentian Wang
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
Gad Singer
Affiliation:
Kantonsspital Baden, Baden, Switzerland
David Vine
Affiliation:
SIGRAY Inc, Concord, California, USA
Wenbing Yun
Affiliation:
SIGRAY Inc, Concord, California, USA
Marco Stampanoni
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
*
*Corresponding author, joan.vila-comamala@psi.ch

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 190 - 191
Copyright
© Microscopy Society of America 2018 

References

[1] Momose, A., et al, Jpn. J. Appl 42 2003 L866–L868.Google Scholar
[2] Weitkamp, T., et al, Opt. Express 13 2005 2062–2068.CrossRefGoogle Scholar
[3] Pfeiffer, F., et al, Nat. Mat 7 2008 134–137.Google Scholar
[4] www.sigray.com.Google Scholar
[5] Vila-Comamala, , et al, Microelectron. Eng. 192 2018 19–24.Google Scholar
[6] The authors would like to thank the technical assistance of Gordan Mikuljan (PSI) and SIGRAY, Inc. during the setup assembly. This work has been partially funded by the ERC-2012-SRG 310005-PhaseX grant and by the Swiss National Science Foundation, SNSF grant number 159263.Google Scholar