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Development of Quantitative STEM for a Conventional S/TEM and Real-Time Current Calibration for Performing QSTEM with a Cold Field Emission Gun

Published online by Cambridge University Press:  23 September 2015

Stephen D. House ,
Long Li ,
C.T. Schamp ,
Russell Henry ,
Dong Su ,
Eric Stach  and
Judith C. Yang
Stephen D. House
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)
Long Li
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)
C.T. Schamp
Affiliation:
Hitachi High Technologies America, Inc., Dallas, TX(USA)
Russell Henry
Affiliation:
Hitachi High Technologies America, Inc., Dallas, TX(USA)
Dong Su
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY(USA)
Eric Stach
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY(USA)
Judith C. Yang
Affiliation:
Dept. of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA(USA)

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2127 - 2128
Copyright
Copyright © Microscopy Society of America 2015 

References

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[2] Singhal, A, et al, Ultramicroscopy 67 (1997). p. 191–206.Google Scholar
[3] Yang, JC, et al, Materials Characterization 51 (2003). p. 101–107.CrossRefGoogle Scholar
[4] LeBeau, JM, et al, Nano Letters 10 (2010). p 4405–4408.Google Scholar
[5] Jones, L, et al, Nano Letters 14 (2014). p 6336–6341.Google Scholar
[6] This work was supported by DOE BES through grant DE FG02-03ER15476, and performed using the facilities at the Nanoscale Fabrication and Characterization Facility at the University of Pittsburgh and the Center for Functional Nanomaterials at Brookhaven National Laboratory, which is supported by DOE BES through contract DE-SC0012704.Google Scholar