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Development of Ultrahigh Resolution Objective Lens Enabling High Analytical Sensitivity

Published online by Cambridge University Press:  30 July 2020

Yu Jimbo ,
Ichiro Ohnishi ,
Hiroki Hashiguchi ,
Yorinobu Iwasawa ,
Shigeyuki Morishita ,
kouji miyatake ,
Masaki Mukai  and
Hidetaka Sawada
Yu Jimbo
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Ichiro Ohnishi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Hiroki Hashiguchi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Yorinobu Iwasawa
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Shigeyuki Morishita
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
kouji miyatake
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Masaki Mukai
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Hidetaka Sawada
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3126 - 3128
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Copyright
Copyright © Microscopy Society of America 2020

References

Morishita, S et al. , Microscopy, 67 (2018) p. 46.10.1093/jmicro/dfy009CrossRefGoogle Scholar
Okunishi, E. et al. ., JEOL News 50, (2015) p. 42.Google Scholar