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Diffractive X-ray Optics for Synchrotrons and Free-Electron Lasers

Published online by Cambridge University Press:  10 August 2018

Christian David ,
Benedikt Rösner ,
Florian Döring ,
Vitaliy Guzenko ,
Frieder Koch ,
Maxime Lebugle ,
Felix Marschall ,
Gediminas Seniutinas ,
Jörg Raabe  and
Benjamin Watts
...Show all authors
Christian David*
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Benedikt Rösner
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Florian Döring
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Vitaliy Guzenko
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Frieder Koch
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Maxime Lebugle
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Felix Marschall
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Gediminas Seniutinas
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Jörg Raabe
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Benjamin Watts
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Daniel Grolimund
Affiliation:
Paul Scherrer Institut, CH-5232Villigen, Switzerland
Zhong Yin
Affiliation:
Georg-August Universität Göttingen, 37077Göttingen, Germany Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
Martin Beye
Affiliation:
Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
Simone Techert
Affiliation:
Georg-August Universität Göttingen, 37077Göttingen, Germany Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany Max Planck Institute for Biophysical Chemistry, 37077Göttingen, Germany
Jens Viefhaus
Affiliation:
Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
Gerald Falkenberg
Affiliation:
Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
Christian Schroer
Affiliation:
Deutsches Elektronen Synchrotron, D-22607Hamburg, Germany
*
*Corresponding author, christian.david@psi.ch

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 264 - 267
Copyright
© Microscopy Society of America 2018 

References

[1] Vartiainen, I, et al., Optics Express 23 2015) p. 13278.Google Scholar
[2] Rosner, B, et al., Optics Express 25 2017) p. 30686.CrossRefGoogle Scholar
[3] Jefimovs, K, et al., Physical Review Letters 99 2007) p. 264801.CrossRefGoogle Scholar
[4] Vila-Comamala, J, et al., Ultramicroscopy 109 2009) p. 1360.Google Scholar
[5] Vila-Comamala, J, et al., Optics Express 19 2011) p. 175.CrossRefGoogle Scholar
[6] Rosner, B, et al., Microelectronic Engineering 191 2018) p. 91.Google Scholar
[7] Karvinen, P, et al., Optics Express 22 2014) p. 16676.Google Scholar
[8] Li, X Bohn, PW Applied Physics Letters 77 2000) p. 2572.Google Scholar
[9] Chang, C Sakdinawat, A Nature. Communications 5 2014) p. 4243.Google Scholar
[10] Lebugle, M, et al., Optics Letters 42 2017) p. 4327.CrossRefGoogle Scholar
[11] Marschall, F, et al., Optics Express 25 2017) p. 15624.Google Scholar
[12] Marschall, F, et al., Scientific Reports 7 2017) p. 8849.Google Scholar