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Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Daniel Nicholls ,
Juhan Lee ,
Houari Amari ,
Andrew Stevens ,
B. Mehdi Layla  and
Nigel Browning
Daniel Nicholls
Affiliation:
University of Liverpool, Liverpool, England, United Kingdom
Juhan Lee
Affiliation:
University of Liverpool, Liverpool, England, United Kingdom
Houari Amari
Affiliation:
University of Liverpool, Liverpool, England, United Kingdom
Andrew Stevens
Affiliation:
Sivananthan Laboratories, Bolingbrook, Illinois, United States
B. Mehdi Layla
Affiliation:
University of Liverpool, Liverpool, England, United Kingdom
Nigel Browning
Affiliation:
Sivananthan Laboratories, Bolingbrook, Illinois, United States

Abstract

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Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3070 - 3071
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Copyright
Copyright © Microscopy Society of America 2020

References

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