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Dose-efficient tcBF-STEM imaging with real-space information beyond the scan sampling limit

Published online by Cambridge University Press:  30 July 2021

Yue Yu ,
Katherine Spoth ,
David Muller  and
Lena Kourkoutis
Yue Yu
Affiliation:
School of Applied and Engineering Physics, Cornell University, United States
Katherine Spoth
Affiliation:
Cornell Center for Materials Research, Cornell University, United States
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States
Lena Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 758 - 760
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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