Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2025-01-01T19:26:10.401Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of Crystal Orientation on Imaging Contrast and Sputter Results during Focused Ion Beam Milling of Cu studied by FIB, EBSD, SEM, and AFM

Published online by Cambridge University Press:  31 July 2006

U Wendt ,
G Nolze  and
H Heyse
U Wendt
Affiliation:
Otto-von-Guericke University
G Nolze
Affiliation:
Federal Institute of Materials Research and Testing
H Heyse
Affiliation:
Otto-von-Guericke University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1302 - 1303
Copyright
© 2006 Microscopy Society of America