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The Effect of Gas Atmospheres on Charging

Published online by Cambridge University Press:  01 August 2002

Xiaohu Tang  and
David C. Joy
Xiaohu Tang
Affiliation:
Electron Microscope Facility, University of Tennessee, Knoxville, TN 37996-0810 USA
David C. Joy
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831-6064 USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1540 - 1541
Copyright
Copyright © Microscopy Society of America 2002