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Electrical Characterization of a Single TiO2 Nanotube by Using Modified FIB/SEM

Published online by Cambridge University Press:  31 July 2006

DK Cha ,
B Lee ,
J Huang ,
J Kim ,
RM Wallace ,
BE Gnade  and
MJ Kim
DK Cha
Affiliation:
University of Texas at Dallas
B Lee
Affiliation:
University of Texas at Dallas
J Huang
Affiliation:
University of Texas at Dallas
J Kim
Affiliation:
University of Texas at Dallas
RM Wallace
Affiliation:
University of Texas at Dallas
BE Gnade
Affiliation:
University of Texas at Dallas
MJ Kim
Affiliation:
University of Texas at Dallas

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1272 - 1273
Copyright
© 2006 Microscopy Society of America