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Electron Microscopy and Analysis 2001, Edited by M. Aindow and C.J. Kiely, Institute of Physics Publishing, Bristol, England, 2001, 650 pages (hardback, $135.00). ISBN 0-7503-0812-5

Published online by Cambridge University Press:  06 December 2002

Yolande Berta
Affiliation:
School of Material Science and Engineering, Georgia Institute of Technology, 771 Ferst Drive, Atlanta, GA 30332-0245
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Extract

This book is a compilation of papers presented at the EMAG (Electron Microscopy and Analysis Group of the Institute of Physics) conference held September 5–7, 2001 at the University of Dundee in Scotland. The papers are four pages long, on average, and grouped by subject matter. This book may make a good reference for anyone well-versed in electron microscopy. The paper topics are focused and detailed about a specific material or technique, with some exceptions, and may not be useful as a general reference to the novice. For example, complicated mathematical derivations, high resolution TEM images, and simulated structures are presented in a number of papers without detailed explanation to the less-initiated reader.

Type
BOOK REVIEW
Copyright
© 2002 Microscopy Society of America

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