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Electron Skirts and X-ray Correction: Evaluating Methods for Rapid Discrimination of Primary versus Secondary X-ray Signals in the ESEM

Published online by Cambridge University Press:  01 August 2005

E Doehne
E Doehne
Affiliation:
Getty Conservation Institute, Los Angeles, California

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 30 - 31
Copyright
© 2005 Microscopy Society of America