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Electron Tomographic Characterization of ErSi2 and GexSi1-x Nanoparticles Prepared by Doping of 4H-SiC

Published online by Cambridge University Press:  31 July 2006

C Kuebel  and
U Kaiser
C Kuebel
Affiliation:
Fraunhofer Institute,Bremen
U Kaiser
Affiliation:
University of Ulm,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1546 - 1547
Copyright
© 2006 Microscopy Society of America