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Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.Energy Sciences Directorate, Brookhaven National Laboratory, Upton, New York 11973, USA
Priyanka Manchanda
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, USA.
Yongji Gong
Affiliation:
School of Materials Science & Engineering, Beihang University, Beijing 100191, China.
Sokrates T. Pantelides
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, USA.
Wu Zhou
Affiliation:
School of Physical Sciences, CAS Key Laboratory of Vacuum Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
Matthew F. Chisholm*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
[5]The authors acknowledge funding U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Science and Engineering Division and support through a user proposal supported by ORNL's Center for Nanophase Materials Sciences, which is sponsored by the Scientific User Facilities Division of U.S. Department of Energy.Google Scholar