We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Russo, C.J. and Henderson, R. “Charge accumulation in electron cryomicroscopy” Ultramicroscopy187, 43–49 (2018).10.1016/j.ultramic.2018.01.009CrossRefGoogle ScholarPubMed
2
Russo, C.J. and Henderson, R. “Microscopic charge fluctuations cause minimal contrast loss in cryo-EM” Ultramicroscopy187, 56–63 (2018).10.1016/j.ultramic.2018.01.011CrossRefGoogle Scholar
3
Russo, C.J. and Henderson, R. “Ewald sphere correction using a single side-band image processing algorithm” Ultramicroscopy187, 26–33 (2018).10.1016/j.ultramic.2017.11.001CrossRefGoogle ScholarPubMed
4
Peet, M.J., Henderson, R. & Russo, C.J. “The energy dependence of contrast and damage in electron cryomicroscopy of biological molecules” Ultramicroscopy203, 125–131 (2019).10.1016/j.ultramic.2019.02.007CrossRefGoogle ScholarPubMed
5
Naydenova, K., McMullan, G., Peet, M.J., Lee, Y., Edwards, P.C., Chen, S., Leahy, E., Scotcher, S., Henderson, R., Russo, C.J. “CryoEM at 100 keV: a demonstration and prospects” IUCrJ6, 1086–1098 (2019).10.1107/S2052252519012612CrossRefGoogle ScholarPubMed