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Enhanced Site specific Preparation of SEM Cross Sections and TEM Samples by using CrossBeam Technology

Published online by Cambridge University Press:  01 August 2002

P. Gnauck ,
P. Hoffrogge ,
M. Schumann  and
G. Bauhammer
P. Gnauck
Affiliation:
LEO Elektronenmikroskopie GmbH, Oberkochen, Germany
P. Hoffrogge
Affiliation:
LEO Elektronenmikroskopie GmbH, Oberkochen, Germany
M. Schumann
Affiliation:
LEO Elektronenmikroskopie GmbH, Oberkochen, Germany
G. Bauhammer
Affiliation:
LEO Elektronenmikroskopie GmbH, Oberkochen, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 546 - 547
Copyright
Copyright © Microscopy Society of America 2002