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Environmental Transmission Electron Microscopy in an Aberration-Corrected Environment

Published online by Cambridge University Press:  12 June 2012

Thomas W. Hansen  and
Jakob B. Wagner
Thomas W. Hansen*
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark
Jakob B. Wagner
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark
*
Corresponding author. E-mail: twh@cen.dtu.dk
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Abstract

The increasing use of environmental transmission electron microscopy (ETEM) in materials science provides exciting new possibilities for investigating chemical reactions and understanding both the interaction of fast electrons with gas molecules and the effect of the presence of gas on high-resolution imaging. A gaseous atmosphere in the pole-piece gap of the objective lens of the microscope alters both the incoming electron wave prior to interaction with the sample and the outgoing wave below the sample. Whereas conventional TEM samples are usually thin (below 100 nm), the gas in the environmental cell fills the entire gap between the pole pieces and is thus not spatially localized. By using an FEI Titan environmental transmission electron microscope equipped with a monochromator and an aberration corrector on the objective lens, we have investigated the effects on imaging and spectroscopy caused by the presence of the gas.

Keywords

environmental transmission electron microscopy (ETEM)aberration correctioncatalysisscattering
Type
Special Section: Aberration-Corrected Electron Microscopy
Information
Microscopy and Microanalysis , Volume 18 , Issue 4 , August 2012 , pp. 684 - 690
Copyright
Copyright © Microscopy Society of America 2012

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