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Examining the Sensitivity of Electron Holography for Two-Dimensional p-n Junction Mapping

Published online by Cambridge University Press:  31 July 2006

Z Wang
Affiliation:
Micron Technology,Inc.
D Li
Affiliation:
Micron Technology,Inc.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Copyright
© 2006 Microscopy Society of America