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Expanding the Dimensions of a Small, Two-Dimensional Diffraction Detector

Published online by Cambridge University Press:  11 August 2020

Xi Chen ,
Matthew R. Hauwiller ,
Abinash Kumar ,
Aubrey N. Penn  and
James M. LeBeau Open the ORCID record for James M. LeBeau [Opens in a new window]
Xi Chen
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA02139, USA
Matthew R. Hauwiller
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA02139, USA
Abinash Kumar
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA02139, USA
Aubrey N. Penn
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC27606, USA
James M. LeBeau*
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA02139, USA
*
*Author for correspondence: James M. LeBeau, E-mail: lebeau@mit.edu
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Abstract

We report an approach to expand the effective number of pixels available to small, two-dimensional electron detectors. To do so, we acquire subsections of a diffraction pattern that are then accurately stitched together in post-processing. Using an electron microscopy pixel array detector (EMPAD) that has only 128 × 128 pixels, we show that the field of view can be expanded while achieving high reciprocal-space sampling. Further, we highlight the need to properly account for the detector position (rotation) and the non-orthonormal diffraction shift axes to achieve an accurate reconstruction. Applying the method, we provide examples of spot and convergent beam diffraction patterns acquired with a pixelated detector.

Keywords

diffuse scatteringdirect electron cameraselectron diffractionhigh dynamic range
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 26 , Issue 5 , October 2020 , pp. 938 - 943
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Copyright
Copyright © Microscopy Society of America 2020

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