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Fast Cross-Sectioning Technique for Thin Films by Ultramicrotomy

Published online by Cambridge University Press:  02 July 2020

Peter Schubert-Bischoff  and
Thomas Krist
Peter Schubert-Bischoff
Affiliation:
BENSC Hahn-Meitner-Institut Berlin, Glienicker Str. 100, D-14109, Berlin, Germany
Thomas Krist
Affiliation:
BENSC Hahn-Meitner-Institut Berlin, Glienicker Str. 100, D-14109, Berlin, Germany
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Extract

The usual method to prepare specimen for transmission electron microscopy (TEM) with an ultramicrotome (UM) is to embed a small piece of the sample in a resin which needs between hours and days to harden. Then the resin is trimmed and finally the thin sections are cut. We developed a method to produce cross sections with an UM without embedding the sample. This leads to first TEM pictures in less then 30 minutes after the end of the thin film production.

We produce neutron mirrors which consist of metallic monolayers (figl) or multilayers (fig.2). The materials we use are mostly cobalt-iron alloys and silicon. The quality of the mirrors critically depends on the structural and hence also on the magnetic properties which are strongly influenced by the settings of the sputter parameters (plasma current, pressure of the working gas, substrate temperature, sputtering high voltage). To find out the best parameters for each purpose a quick analysing method is needed for a fast feedback

Type
Technologists’ Forum: Special Topics and Symposium
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 359 - 360
Copyright
Copyright © Microscopy Society of America 1997

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References

Malis, T. F. and Steele, D., Specimen Preparation for TEM of Materials II, Mat. Res. Soc. Symp. Proc. 199 (1990) 310.1557/PROC-199-3CrossRefGoogle Scholar
Mezei, F., Commun. Phys. 1 (1976) 81; Mezei, F. and Dagleish, P. A., Commun. Phys. 2 (1977) 41; Krist, Th., Pappas, C., Keller, Th., and Mezei, F., Physica B 214&214 (1995) 939Google Scholar
Becker, O. and Bange, K., Ultramicroscopy 52 (1993) 7310.1016/0304-3991(93)90023-QCrossRefGoogle Scholar