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Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis – ERRATUM

Published online by Cambridge University Press:  29 May 2018

A. Liebel ,
G. Lutz ,
U. Weber ,
A. Niculae  and
H. Soltau

Abstract

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Type
Correction
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2447
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Schropp, A, et al., (2015) High-Resolution Phase-Contrast Imaging at XFELs. Microsc Microanal 21, Suppl 3 doi:10.1017/S1431927615011617.Google Scholar
[2] Liebel, A, et al., (2014) Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis. Microsc Microanal 21, Suppl 3 doi:10.1017/S143192761501507X.Google Scholar