No CrossRef data available.
Article contents
Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis
Published online by Cambridge University Press: 23 September 2015
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2169 - 2170
- Copyright
- Copyright © Microscopy Society of America 2015
References
[1]
Liebel, A, et al., Microscopy & Microanalysis vol. 20(S3 (2014). pp. 28–29.CrossRefGoogle Scholar
You have
Access