Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-29T11:19:11.798Z Has data issue: false hasContentIssue false
  • English
  • Français

Ferroelectric Domain Structure of PZT Tetragonal Single Crystals Analysed by Scanning Probe Microscopy

Published online by Cambridge University Press:  21 August 2009

J. A. Pérez ,
I. K. Bdikin ,
A. M. R. Senos ,
P. Q. Mantas  and
A. L. Kholkin
J. A. Pérez
Affiliation:
Department of Ceramics and Glass Engineering, CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
I. K. Bdikin
Affiliation:
Department of Ceramics and Glass Engineering, CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
A. M. R. Senos
Affiliation:
Department of Ceramics and Glass Engineering, CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
P. Q. Mantas
Affiliation:
Department of Ceramics and Glass Engineering, CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
A. L. Kholkin
Affiliation:
Department of Ceramics and Glass Engineering, CICECO, University of Aveiro, 3810-193 Aveiro, Portugal

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

From the application point of view, the most interesting compositions in the lead zirconate titanate solid solutions, PbZrxTi1-xO3 (PZT), are those near the centre of the phase diagram, where tetragonal and rhombohedral phases are separated by a boundary nearly independent on temperature. The composition of this so-called morphotropic phase boundary (MPB) is approximately 52/48 at room temperature. The piezoelectric coefficients, electromechanical coupling coefficients, dielectric permittivity and remnant polarization measured on ceramic samples reach a maximum in this region, not necessarily at the same composition, which explains why these compositions are technologically so interesting.

Type
Materials Sciences
Information
Microscopy and Microanalysis , Volume 15 , Supplement S3 , July 2009 , pp. 83 - 84
Copyright
Copyright © Microscopy Society of America 2009